The PHI 5800 X-ray photoelectron spectrometer (XPS) is equipped with a dual source anode (Al and Mg), a hemispherical analyzer for XPS and Auger electron spectroscopy (AES) analysis, including ...

Description: ISO/TR 18394:2006 provides guidelines for identifying chemical effects in X-ray or electron-excited Auger-electron spectra and for using these effects in chemical characterization.

(Image: A. Carlson, Wikimedia Commons, in the public domain) Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) are both essential for analyzing material surfaces, offering ...

Auger spectra secondary electron images of surfaces elemental line scans and maps and depth profiles. The depth distribution of components at and near the surface can be evaluated by using AES in ...

In a recent article, researchers analyzed electron-cloud alignment in atomic argon induced by intense XFEL pulses. The study ...

The intense, brief pulses of X-rays from upcoming free-electron lasers will greatly extend X-ray microscopy to the femtosecond time domain and to interatomic length scales. From recent experiments ...

With free-electron lasers, such as the one that will soon be operating at the Stanford Linear Accelerator Center, X-ray microscopy will eventually allow us to image dynamics of molecules on the ...