Researchers at Nagoya University in Japan used atomic-resolution secondary electron (SE) imaging to capture the atomic structure of the very top layer of materials to better understand the ...
Researchers used atomic-resolution secondary electron (SE) imaging to capture the atomic structure of the very top layer of materials to better understand the differences from its lower layers.
An undergraduate student in physics at The University of Texas at Arlington earned a top award from the Texas Section of the American Physical Society ...
Jeol JSM-6010LV High performance, fast imaging microscope with adjustable high and low vacuum settings (variable pressure), secondary electron imaging and three types of backscattered electron imaging ...